| N5249B-201 | 2-port, configurable test set |
| N5249B-217 | 2-port, configurable test set, source attenuators, receiver
attenuators |
| N5249B-219 | 2-port, configurable test set, source attenuators, receiver
attenuators, bias tees |
| N5249B-222 | 2-port, configurable test set, source attenuators, receiver
attenuators, second source, combiner, mechanical switches |
| N5249B-224 | 2-port, configurable test set, source attenuators, receiver
attenuators, bias tees, second source, combiner, mechanical
switches |
| N5249B-401 | 4-port, configurable test set, with second source |
| N5249B-417 | 4-port, configurable test set, second source, source attenuators,
receiver attenuators |
| N5249B-419 | 4-port, configurable test set, second source, source attenuators,
receiver attenuators, bias tees |
| N5249B-422 | 4-port, configurable test set, second source, source attenuators,
receiver attenuators, combiner, mechanical switches |
| N5249B-423 | 4-port, configurable test set, second source, source attenuators,
receiver attenuators, bias tees, combiner, mechanical switches |
| N5249B-425 | 4-port, configurable test set, second source, attenuators,
combiner, mechanical switches, bias tees, low frequency extension |
| N5249B-1A7 | Calibration + Uncertainties + Guardbanding (Not Accredited) |
| N5249B-A6J | ANSI Z540-1-1994 Calibration |
| N5249B-UK6 | Commercial calibration certificate with test data |
| N5249B-020 | Add IF inputs |
| N5249B-021 | Add pulse modulator to internal 1st source |
| N5249B-022 | Add pulse modulator to internal 2nd source |
| N5249B-029 |
Add noise receiver to 8.5 GHz |
| N5249B-UNY | Enhanced low phase noise performance |
| N5249B-XSB | | Third RF source up to 8.5 GHz |
|
| Software with Subscription | |
| S93007B | Automatic fixture removal |
| S93010B | Time-domain analysis |
| S93011B | Enhanced time domain analysis with TDR |
| S93015B | Real-time S-parameter and power measurement uncertainty |
| S93025B | Basic pulsed-RF measurements |
| S93026B | Advanced pulsed-RF measurements |
| S93027B | Mechanical noise tuner control |
| S93029B | Noise figure measurements with vector correction |
| S930700B | Modulation distortion up to 8.5 GHz |
| S930701B | Modulation distortion up to 13.5 GHz |
| S930702B | Modulation distortion up to 26.5 GHz |
| S930704B | Modulation distortion up to 43.5 GHz |
| S930705B | Modulation distortion up to 50 GHz |
| S930707B | Modulation distortion up to 70 GHz |
| S93080B | Frequency-offset measurements |
| S93082B | Scalar mixer/converter measurements |
| S93083B | Vector and scalar mixer/converter measurements |
| S93084B | Embedded-LO capability |
| S93086B | Gain-compression measurements |
| S93087B | Intermodulation distortion measurements |
| S93088B | Source phase control |
| S93089B | Differential and I/Q device measurements |
| S930900B | Spectrum analysis up to 8.5 GHz |
| S93110B | Active hot parameters |
| S93118B | Fast CW measurements |
| S93460B | True-mode stimulus |
| S93551B | N-port measurements |
| S93898B | Built-in performance test software |
| S94510B | Nonlinear component characterization |
| S94511B | Nonlinear component characterization, restricted to 50GHz |
| S94514B | Nonlinear X-parameters |
| S94518B | Nonlinear pulse envelope domain |
| S94520B | Arbitrary load impedance, X-parameters |
| S94521B | Arbitrary load control, X-parameters |
| S94522B | Arbitrary load control, device characterization |
| S930317B | Phase noise measurement up to 70 GHz |
| S930321B | Phase noise measurement up to 125 GHz |
| S94522B | Arbitrary load control, device characterization |
| S930317B | Phase noise measurement up to 70 GHz |
| S930321B | Phase noise measurement up to 125 GHz |
| S93072B | Internal 6 GHz Arbitrary Waveform Generation |
| S94601B | Device measurement eXpert - DMX |
| S94602B | Limit assistant |
